What is this HS code?
HTS 9031.49.70.00 corresponds to “For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices.” Final classification still depends on material, use, specifications, and statistical suffix.
Description
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
Data source and update date
Base source: USITC HTS revision feed, retrieved 2026-09-07. Additional-layer rates are not currently published.